Atom Probe
What Is Atom Probe Tomography?
APT is a technique that reconstructs a three-dimensional atomic-scale map of a small specimen by detecting and identifying evaporated ions from the sample surface. The result is a dataset that shows elemental identity and spatial position, enabling precise analysis of nanoscale chemistry.
APT is particularly valuable when conventional techniques cannot resolve:
Nanoscale precipitates and clusters
Grain boundary segregation
Interface chemistry in multilayers
Trace elements affecting reliability
Early-stage phase separation
Why Use Atom Probe?
Atom Probe is used when you need both:
3D nanoscale distribution (not just 2D)
High elemental sensitivity (including minor or trace elements)
Typical questions APT can answer:
Where are key elements concentrated in the microstructure?
Are impurities or dopants segregating to grain boundaries?
What is the chemistry at an interface or thin layer?
Are nanoscale precipitates present, and what is their composition?
How does processing or heat treatment change element distribution?
Typical Application Scenarios
Semiconductor & Microelectronics
Dopant distribution and segregation
Interface chemistry in multilayers and barrier layers
Reliability investigations for nanoscale defects
Metals & Alloys
Precipitate composition and size distribution
Grain boundary segregation leading to embrittlement
Heat-treatment optimization and phase evolution
Battery & Energy Materials
Elemental heterogeneity in active materials
Degradation-related segregation at interfaces
Nanoscale compositional evolution after cycling
Advanced Coatings & Thin Films
Interlayer diffusion and interface reactions
Composition gradients across thin layers
Failure investigations in multilayer systems
Failure Analysis & Root-Cause Investigations
Trace element segregation linked to cracking or corrosion
Interfacial composition changes leading to delamination
Nanoscale features that are not visible by conventional microscopy
What Materials Can Be Analyzed?
APT is commonly applied to:
Metals and alloys (steel, aluminum alloys, superalloys, titanium alloys)
Semiconductor materials and devices
Thin films and multilayer structures
Some advanced ceramics and complex materials (depending on sample preparation feasibility)
If you are unsure whether your material is suitable, Xinbodi can evaluate sample feasibility based on your material system and analysis objectives.
What You Will Receive
Every Atom Probe project includes a structured deliverable package designed for technical decision-making. A typical report includes:
Project objective and sample information
Test plan and analysis conditions (as applicable)
3D reconstruction and elemental maps (key regions)
Quantitative composition results for:
Specific phases / precipitates
Grain boundaries / interfaces
Selected regions of interest
Statistical analysis (when applicable):
Cluster/precipitate characterization
Size and composition distributions
Interpretation and engineering insights:
Mechanism hypotheses (if failure-related)
Correlation to processing conditions
Recommendations for follow-up testing or optimization
Why Choose Xinbodi for Atom Probe?
Every Atom Probe project is supported by a clear analytical strategy and expert interpretation—so you receive conclusions, not just raw datasets.
High-resolution nanoscale chemical analysis for complex materials
Strong experience in microstructure-driven problems and interface chemistry
Structured reporting focused on engineering decisions
Support for failure analysis, R&D, and process optimization
Confidential handling of proprietary materials and IP-sensitive projects
How to Start an Atom Probe Project
To help us design an efficient plan, it’s helpful to share:
Material type and processing history (if available)
Your key question (e.g., segregation, precipitates, interface diffusion)
Whether there is a “good vs. bad” comparison sample
Any existing microscopy or compositional data (optional)
Xinbodi can recommend the most efficient workflow and determine whether complementary techniques (e.g., SEM/EDS, TEM, XPS, SIMS) are beneficial.
FAQs
Is Atom Probe the same as SEM/EDS or TEM/EDS?
No. SEM/EDS and TEM/EDS provide valuable compositional information, but Atom Probe offers 3D atomic-scale mapping with very high sensitivity, particularly useful for segregation, precipitates, and interface chemistry.
Can APT quantify trace elements?
APT can detect and quantify minor/trace elemental distributions in nanoscale regions, depending on sample and analysis conditions.
Does APT work for any sample?
APT requires specialized specimen preparation and not all materials are equally suitable. Xinbodi can assess feasibility based on your material system and objective.
Is APT used for failure analysis?
Yes. APT is widely used to identify nanoscale segregation or phase changes that contribute to cracking, embrittlement, corrosion, or interfacial failure.
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