CryO-FIB/SEM
What Is Cryo-FIB/SEM?
Cryo-FIB/SEM is an advanced microscopy technique where samples are rapidly frozen and maintained at low temperatures during preparation and imaging. This approach minimizes:
beam damage
dehydration and shrinkage
melting or volatilization
structural collapse of soft materials
By combining cryo-FIB cross-sectioning with cryo-SEM imaging, internal morphology and interfaces can be observed in a state much closer to real operating or native conditions.
Why Use Cryo-FIB/SEM?
Cryo-FIB/SEM is selected when conventional FIB/SEM is limited due to sample sensitivity. It is especially valuable for:
soft polymers and elastomers
hydrated or solvent-containing materials
biological or bio-inspired materials
battery and energy materials sensitive to air or beam exposure
coatings, gels, adhesives, and composites with low thermal stability
Typical questions Cryo-FIB/SEM can answer:
What is the true internal structure without drying artifacts?
How are layers, pores, or phases arranged inside the material?
Are cracks, voids, or delamination present under real conditions?
How do interfaces behave in soft or frozen systems?
What Cryo-FIB/SEM Can Reveal
Cryo-FIB/SEM provides insight into:
internal micro- and nano-structure
multilayer and interfacial morphology
porosity and void distribution
phase separation in soft or composite materials
fracture features and failure initiation sites
particle dispersion and agglomeration
When combined with analytical tools (e.g., EDS, when feasible), Cryo-FIB/SEM can also support localized compositional understanding.
Typical Application Scenarios
Soft Materials & Polymers
Elastomers, gels, hydrogels, and low-melting polymers
Internal morphology without deformation or collapse
Interface evaluation in layered soft systems
Battery & Energy Materials
Frozen electrolyte–electrode interfaces
Porous electrode structure and degradation features
Moisture- or air-sensitive components
Coatings, Adhesives & Sealants
Cross-sectioning of soft or tacky coatings
Adhesion and interfacial integrity evaluation
Failure analysis of delamination or void formation
Biological & Bio-Inspired Materials
Hydrated structures preserved close to native state
Porous or composite biological materials
Structural evaluation without chemical fixation artifacts
Failure Analysis of Sensitive Samples
Cracks, voids, and defects that change under room-temperature conditions
Comparison of “as-failed” vs. altered structures
Root-cause investigations where standard prep is not suitable
Sample Types
Cryo-FIB/SEM is commonly applied to:
soft polymers and elastomers
coatings and multilayer films
composites containing soft phases
battery components and energy materials
biological or hydrated materials (case-dependent)
Xinbodi evaluates sample feasibility based on size, composition, and sensitivity to temperature, vacuum, and ion/electron beams.
What You Will Receive
Each Cryo-FIB/SEM project is delivered with a clear, structured report designed to support technical decision-making. A typical deliverable includes:
project objective and sample description
cryogenic preparation and imaging conditions
high-resolution cryo-SEM images
cross-section images revealing internal structure and interfaces
comparison summaries (e.g., good vs. failed, treated vs. untreated)
interpretation of observed features and failure mechanisms
recommendations for follow-up testing or process optimization
Why Choose Xinbodi for Cryo-FIB/SEM?
Experience with beam-sensitive and soft materials
Careful cryogenic handling to preserve native structure
Integrated FIB/SEM expertise for complex cross-sectioning tasks
Clear interpretation focused on structure–performance relationships
Support for R&D, troubleshooting, and failure investigations
Confidential handling of proprietary and IP-sensitive samples
FAQs
How is Cryo-FIB/SEM different from standard FIB/SEM?
Cryo-FIB/SEM keeps the sample frozen, reducing beam damage and structural changes. This is critical for soft, hydrated, or volatile materials that deform under standard conditions.
Is Cryo-FIB/SEM destructive?
Yes. FIB milling is inherently destructive to the analyzed region, but it allows controlled, site-specific cross-sectioning with minimal artifacts.
Can Cryo-FIB/SEM be combined with other techniques?
Yes. Results are often complemented by SEM-EDS, surface analysis, or materials characterization techniques to provide a more complete understanding.
Does every sample require cryogenic analysis?
No. Cryo-FIB/SEM is recommended only when room-temperature preparation risks altering the true structure.
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