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CryO-FIB/SEM

What Is Cryo-FIB/SEM?

Cryo-FIB/SEM is an advanced microscopy technique where samples are rapidly frozen and maintained at low temperatures during preparation and imaging. This approach minimizes:

  • beam damage

  • dehydration and shrinkage

  • melting or volatilization

  • structural collapse of soft materials

By combining cryo-FIB cross-sectioning with cryo-SEM imaging, internal morphology and interfaces can be observed in a state much closer to real operating or native conditions.

Why Use Cryo-FIB/SEM?

Cryo-FIB/SEM is selected when conventional FIB/SEM is limited due to sample sensitivity. It is especially valuable for:

  • soft polymers and elastomers

  • hydrated or solvent-containing materials

  • biological or bio-inspired materials

  • battery and energy materials sensitive to air or beam exposure

  • coatings, gels, adhesives, and composites with low thermal stability

Typical questions Cryo-FIB/SEM can answer:

  • What is the true internal structure without drying artifacts?

  • How are layers, pores, or phases arranged inside the material?

  • Are cracks, voids, or delamination present under real conditions?

  • How do interfaces behave in soft or frozen systems?

What Cryo-FIB/SEM Can Reveal

Cryo-FIB/SEM provides insight into:

  • internal micro- and nano-structure

  • multilayer and interfacial morphology

  • porosity and void distribution

  • phase separation in soft or composite materials

  • fracture features and failure initiation sites

  • particle dispersion and agglomeration

When combined with analytical tools (e.g., EDS, when feasible), Cryo-FIB/SEM can also support localized compositional understanding.

Typical Application Scenarios

Soft Materials & Polymers

  • Elastomers, gels, hydrogels, and low-melting polymers

  • Internal morphology without deformation or collapse

  • Interface evaluation in layered soft systems

Battery & Energy Materials

  • Frozen electrolyte–electrode interfaces

  • Porous electrode structure and degradation features

  • Moisture- or air-sensitive components

Coatings, Adhesives & Sealants

  • Cross-sectioning of soft or tacky coatings

  • Adhesion and interfacial integrity evaluation

  • Failure analysis of delamination or void formation

Biological & Bio-Inspired Materials

  • Hydrated structures preserved close to native state

  • Porous or composite biological materials

  • Structural evaluation without chemical fixation artifacts

Failure Analysis of Sensitive Samples

  • Cracks, voids, and defects that change under room-temperature conditions

  • Comparison of “as-failed” vs. altered structures

  • Root-cause investigations where standard prep is not suitable

Sample Types

Cryo-FIB/SEM is commonly applied to:

  • soft polymers and elastomers

  • coatings and multilayer films

  • composites containing soft phases

  • battery components and energy materials

  • biological or hydrated materials (case-dependent)

Xinbodi evaluates sample feasibility based on size, composition, and sensitivity to temperature, vacuum, and ion/electron beams.

What You Will Receive

Each Cryo-FIB/SEM project is delivered with a clear, structured report designed to support technical decision-making. A typical deliverable includes:

  • project objective and sample description

  • cryogenic preparation and imaging conditions

  • high-resolution cryo-SEM images

  • cross-section images revealing internal structure and interfaces

  • comparison summaries (e.g., good vs. failed, treated vs. untreated)

  • interpretation of observed features and failure mechanisms

  • recommendations for follow-up testing or process optimization

Why Choose Xinbodi for Cryo-FIB/SEM?

  • Experience with beam-sensitive and soft materials

  • Careful cryogenic handling to preserve native structure

  • Integrated FIB/SEM expertise for complex cross-sectioning tasks

  • Clear interpretation focused on structure–performance relationships

  • Support for R&D, troubleshooting, and failure investigations

  • Confidential handling of proprietary and IP-sensitive samples

FAQs

Cryo-FIB/SEM keeps the sample frozen, reducing beam damage and structural changes. This is critical for soft, hydrated, or volatile materials that deform under standard conditions.

Yes. FIB milling is inherently destructive to the analyzed region, but it allows controlled, site-specific cross-sectioning with minimal artifacts.

Yes. Results are often complemented by SEM-EDS, surface analysis, or materials characterization techniques to provide a more complete understanding.

No. Cryo-FIB/SEM is recommended only when room-temperature preparation risks altering the true structure.

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