LA-CP-MS

What Is LA-ICP-MS?

LA-ICP-MS uses a focused laser beam to ablate microscopic amounts of material from a solid sample. The ablated aerosol is transported into an inductively coupled plasma, where elements are ionized and analyzed by mass spectrometry.

This approach allows direct solid sampling without the need for bulk digestion, preserving spatial information that would otherwise be lost.

What LA-ICP-MS Measures

LA-ICP-MS provides:

Trace and ultra-trace elemental concentrations
Elemental mapping and spatial distribution
Local compositional variations
Depth profiling of coatings and layers
Elemental ratios and impurity patterns

It combines the sensitivity of ICP-MS with the spatial resolution of laser-based microanalysis.

Why Use LA-ICP-MS?

LA-ICP-MS is chosen when where an element is located is as important as how much is present. It helps answer questions such as:

Are trace impurities uniformly distributed or localized?
How does elemental composition vary across layers or interfaces?
Are contaminants concentrated at grain boundaries or defects?
Did processing introduce local elemental inhomogeneity?
How does composition change with depth?

Typical Application Scenarios

Thin Films & Coatings

Elemental depth profiling
Detection of interlayer diffusion
Impurity distribution across coatings

Metals & Alloys

Micro-scale impurity analysis
Elemental segregation at grain boundaries
Comparison of processing or heat-treatment effects

Semiconductors & Electronic Materials

Dopant distribution analysis
Trace contamination mapping
Reliability and failure investigations

Geological & Advanced Inorganic Materials

Trace element fingerprinting
Local compositional heterogeneity
Research and materials development

Failure Analysis

Identification of localized elemental contributors to failure
Comparison of “good vs. failed” regions
Correlation of elemental distribution with cracks or defects

Sample Types

LA-ICP-MS is commonly applied to:

metals and alloys
coatings and multilayer systems
ceramics and glasses
semiconductors and electronic materials
solid inorganic materials

Xinbodi evaluates sample surface quality, geometry, and analytical goals to select optimal laser parameters.

What You Will Receive

Each LA-ICP-MS project is delivered with a clear, structured report suitable for technical and decision-making use. A typical deliverable includes:

project objective and sample description
laser ablation and ICP-MS conditions
quantitative elemental results
elemental maps or line scans (when applicable)
depth profile data (if performed)
comparison summaries between regions or samples
interpretation of elemental distribution and its impact
recommendations for follow-up testing or process optimization

Why Choose Xinbodi for LA-ICP-MS?

High-sensitivity trace element detection
Spatially resolved elemental analysis capability
Minimal sample preparation with preserved structure
Expertise in data interpretation and mapping
Support for R&D, QC, and failure investigations
Strict confidentiality for proprietary materials and dat