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SEM

What is SEM?

SEM (Scanning Electron Microscopy) is an imaging technique that uses a focused electron beam to scan a sample surface and generate high-resolution images of surface morphology and microstructure. Compared with optical microscopy, SEM offers much higher magnification and depth of field, making it ideal for observing fine features such as cracks, pores, particles, coatings, and fracture surfaces.

SEM is often paired with EDS/EDX (Energy-Dispersive X-ray Spectroscopy) to provide elemental composition information from specific points or mapped areas.

What SEM Can Help You Solve

  • Defect and failure analysis: cracks, delamination, voids, fracture origin, corrosion features

  • Foreign particle / contamination analysis: particle morphology + elemental screening

  • Surface and coating evaluation: coating integrity, thickness indication (with cross-section), uniformity issues

  • Process troubleshooting: abnormal residues, deposits, and surface damage after processing

  • Material comparison: supplier/lot comparisons, before/after aging or environmental exposure

  • Microstructure characterization: grain features, fillers, dispersion, interfaces (project-dependent)

Typical Applications

  • Semiconductor & electronics: particles on wafers/components, residues, corrosion, solder/metal defects

  • Metals & alloys: fracture surfaces, corrosion products, inclusions, surface treatments

  • Polymers & composites: filler distribution, interfacial failure, fracture morphology, contamination particles

  • Coatings & thin films: surface defects, cracking, pinholes, delamination, cross-section evaluation

  • Batteries & energy materials: electrode morphology, particle size/shape, degradation features

  • General QC & R&D: micro-defects, morphology benchmarking, product comparison

Capabilities & What You Receive

SEM Imaging

  • High-magnification imaging of surface topography

  • Fracture surface imaging for root-cause support

  • Cross-section imaging (sample-dependent; preparation may be required)

  • Image documentation at multiple magnifications with scale bars

Optional: EDS/EDX Elemental Analysis

  • Point analysis: elemental screening of a specific spot

  • Line scan: elemental change across an interface (project-dependent)

  • Elemental mapping: distribution of elements across an area (qualitative/semi-quantitative)

Deliverables

  • SEM images (annotated with magnification/scale)

  • EDS spectra and elemental results (if requested)

  • Summary of key observations and comparison conclusions (if applicable)

Sample Requirements

  • Sample types: solids, powders, particles, films, coatings, metals, ceramics, composites

  • Size guideline: ideally small pieces that fit the SEM stage (we can advise if needed)

  • Cleanliness: avoid fingerprints and loose contamination; store in clean containers

  • Conductivity: non-conductive samples may require conductive coating (e.g., carbon/gold) to reduce charging

  • Information to provide: target features/defects, expected materials, and any safety concerns (SDS if needed)

Workflow

  • Requirement review (imaging only vs imaging + EDS; target defect/area; comparison plan)

  • Sample receiving & documentation (photos, labeling, handling notes)

  • Sample preparation (mounting, conductive coating, optional cross-section prep as applicable)

  • SEM imaging (multi-magnification documentation)

  • EDS analysis (point/line/map if requested)

  • Reporting (images + results + interpretation and next-step recommendations)

FAQs

SEM shows morphology; EDS can provide elemental composition to help classify the particle (e.g., metal oxide vs silica vs polymer with fillers). For full molecular identification, we may recommend FTIR/Raman/GC-MS depending on the material type.

Non-conductive samples often need a thin conductive coating to prevent charging. The coating is typically very thin, but it can affect extremely surface-sensitive measurements. If coating is a concern, we can discuss low-vacuum modes or alternative approaches (project-dependent).

Thickness measurement usually requires a cross-section with appropriate preparation. If you need thickness values, provide the requirement and we will plan sample prep accordingly.

EDS is generally semi-quantitative and best for screening and comparison. Accuracy depends on standards, matrix effects, and measurement conditions.

Resolution depends on instrument settings and sample conditions, but SEM typically resolves features far smaller than optical microscopy. If you share your target feature size and sample type, we can recommend the best approach.

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  • yangxbd@gmail.com