PIXE

What Is PIXE?

PIXE works by bombarding a sample with a focused beam of charged particles (typically protons). This interaction causes atoms in the sample to emit characteristic X-rays, which are detected and analyzed to determine elemental composition.

Because each element emits X-rays at unique energies, PIXE enables simultaneous identification and quantification of multiple elements.

What PIXE Measures

PIXE can detect and quantify:

Major, minor, and trace elements
Elemental composition of solids
Trace impurities at ppm or sub-ppm levels
Elemental distributions in near-surface regions

PIXE offers high sensitivity for mid-to-heavy elements and provides reliable quantitative results when properly calibrated.

Why Use PIXE?

PIXE is chosen when:

non-destructive elemental analysis is required
trace element sensitivity is important
multi-element data is needed quickly
minimal sample preparation is preferred

Typical questions PIXE can answer:

What elements are present and at what concentrations?
Are trace impurities contributing to performance issues?
Do different samples have the same elemental fingerprint?
Did processing introduce unexpected elements?
How does elemental composition vary between regions?

Typical Application Scenarios

Materials Characterization

Elemental profiling of metals, ceramics, and inorganic materials
Comparison of formulations or processing routes
Support for materials selection and qualification

Impurity & Contamination Analysis

Detection of trace elemental contaminants
Investigation of foreign material introduction
Root-cause analysis of performance or reliability issues

Failure Analysis

Identification of elemental contributors to corrosion or degradation
Comparison of “good vs. failed” samples
Localization of elemental anomalies

Research & Development

Trace element fingerprinting
Evaluation of new materials
Support for advanced materials research

Quality Control & Supplier Qualification

Incoming material inspection
Batch-to-batch elemental consistency verification
Supplier comparison studies

Sample Types

PIXE can be applied to:

metals and alloys
ceramics and glasses
coatings and thin layers
inorganic and composite materials

Samples typically require minimal preparation, and the technique preserves the integrity of the tested area.

What You Will Receive

Each PIXE project is delivered with a clear, structured report suitable for technical and decision-making use. A typical deliverable includes:

project objective and sample description
PIXE measurement conditions
quantitative elemental results
impurity concentration tables
comparison summaries between samples or regions
interpretation of elemental data and its impact
recommendations for follow-up analysis if required

Why Choose Xinbodi for PIXE?

Non-destructive elemental analysis capability
High sensitivity for trace elements
Multi-element detection in a single measurement
Minimal sample preparation requirements
Clear interpretation linked to application needs
Confidential handling of proprietary materials and data