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XRF

What is XRF?

XRF (X-ray Fluorescence) is a non-destructive elemental analysis technique that identifies and measures elements in a material by detecting the characteristic X-ray “fluorescence” emitted after X-ray excitation. XRF is widely used for fast screening of metals and inorganic elements in solids, powders, coatings, and some liquids.

XRF is ideal for material verification, alloy identification, coating composition checks, contamination screening, and QC, offering rapid multi-element results with minimal sample preparation.

What XRF Can Help You Solve

  • Alloy and material identification (grade verification, mix-up prevention)

  • Elemental composition screening for metals, minerals, ceramics, and powders

  • RoHS/halogen screening support (method- and matrix-dependent)

  • Coating and plating composition checks (qualitative/semi-quantitative)

  • Contamination and foreign material screening (unexpected metals/inorganics)

  • Batch-to-batch / supplier comparison for QC and incoming inspection

Typical Applications

  • Metals & alloys: PMI (positive material identification), alloy sorting and verification

  • Mining/minerals/cement: elemental screening of ores and inorganic materials

  • Electronics & consumer products: screening for restricted elements (project-dependent)

  • Plating/coatings: composition checks, process monitoring (project-dependent)

  • Recycling & scrap sorting: rapid alloy classification

  • General QC & R&D: fast elemental checks before deeper analysis (ICP, GDMS, etc.)

Capabilities & What You Receive

Measurement Capabilities

  • Multi-element analysis for many elements from about Na/Mg to U (range depends on instrument and setup)

  • Qualitative and semi-quantitative results for composition screening

  • Grade/identity comparison against known standards or reference materials (when provided)

  • Multiple spot measurements across a sample to assess uniformity (optional)

Deliverables

  • Element list with measured values (e.g., wt% or ppm, project-dependent)

  • Spectrum and peak identification summary (as needed)

  • Comparison/pass-fail vs your specification (if provided)

  • Notes on measurement limitations and matrix effects

Sample Requirements

  • Sample types: solid metal parts, powders, pellets, ceramics, glass, coatings (matrix dependent)

  • Surface condition: clean, dry, flat surfaces improve accuracy; remove oils/loose oxides if appropriate

  • Powders: provide enough for stable presentation (pellet/cup as applicable)

  • Coatings: provide coating type and approximate thickness if known (thin coatings can be challenging)

  • Information to provide: target elements, expected composition range, alloy grade (if known), and any relevant standard/spec

Workflow

  • Requirement review (ID vs composition; target elements; acceptance criteria)

  • Sample check & preparation (cleaning, flattening guidance, powder presentation)

  • Instrument setup & calibration/verification (as applicable)

  • XRF measurement (single or multiple spots)

  • Data processing (peak ID, quant calculation, comparison)

  • Reporting (results + conditions + conclusions)

FAQs

XRF is generally non-destructive. It may require light surface cleaning for best results.

XRF is excellent for major/minor elements and screening, but ultra-trace detection can be limited by matrix and measurement time. For very low detection limits, ICP-MS, GDMS, or TXRF may be more suitable.

XRF can screen coating composition, but accuracy depends on coating thickness, substrate interference, and whether a dedicated coating-thickness XRF configuration is used. Share coating/substrate details for best guidance.

XRF cannot measure hydrogen and typically cannot measure carbon reliably. Light-element capability depends on instrument configuration; for C/H/O/N-focused questions, consider combustion analysis, FTIR, or XPS.

XRF is faster with minimal prep and is non-destructive. ICP methods usually provide lower detection limits and broader quantitative accuracy, but require digestion and more preparation time.

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