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NanoIR

What Is NanoIR (AFM-IR / Photothermal Nano-IR)?

NanoIR (often written nano-IR and commonly referring to AFM-IR / Photothermal AFM-IR) is a nanoscale infrared spectroscopy technique that combines atomic force microscopy (AFM) with IR absorption spectroscopy to deliver chemical identification and IR mapping far below the optical diffraction limit. It works by using the AFM tip to detect local photothermal expansion caused by IR absorption—producing IR spectra that can closely correlate with conventional FTIR libraries, but with much higher spatial resolution.

In practical terms, NanoIR lets you answer: “What is this tiny domain/particle/layer made of?” and “How are chemical components distributed at the nanoscale?”—especially in heterogeneous materials like polymers, coatings, composites, and microelectronics structures.

What NanoIR Is Used For

NanoIR is commonly used to:

  • Identify polymer domains in blends and multilayers (e.g., phase separation, migration, blooming)

  • Map additives, contaminants, residues, and thin organic films at micro/nanoscale (project-dependent)

  • Characterize coatings and interfaces where chemistry changes over very small distances

  • Investigate failure and reliability issues tied to localized chemistry (delamination interfaces, residues, cracking origins—project-dependent)

  • Analyze microelectronics and thin-film stacks for organic/inorganic chemistry differences at the nanoscale (project-dependent)

  • Study biomaterials and other complex heterogeneous samples (project-dependent)

Why NanoIR (vs. FTIR, Raman, or SEM-EDS)?

Compared with conventional FTIR microscopy:
FTIR imaging is typically diffraction-limited (micron-scale), while NanoIR pushes chemical mapping into the nano-regime for localized domains and thin features.

Compared with Raman microscopy:
Raman can be very powerful, but some samples fluoresce or have weak Raman signatures. NanoIR provides IR-absorption-based contrast that often aligns well with FTIR interpretation.

Compared with SEM-EDS:
EDS provides elemental info, not molecular bonding/functional groups. NanoIR provides chemical bonding fingerprints for organics and many polymer systems.

Sample Types We Support

NanoIR is best for relatively flat, accessible surfaces (project-dependent), including:

  • Polymers & plastics: blends, multilayer films, molded parts, fibers

  • Adhesives & sealants: bondlines, residues, interfacial films (project-dependent)

  • Coatings & thin films: organic coatings, functional layers, contamination films

  • Electronics & semiconductors: organic residues, interfaces, thin polymer layers (project-dependent)

  • Medical devices & packaging materials: thin films, residues, surface chemistry questions (project-dependent)

Best practice: send a reference/control (known-good) sample plus the suspect sample for side-by-side comparison.

Typical Workflows

Nanoscale Chemical ID at a Specific ROI

Best for: “What is this tiny spot/domain?”

  • Locate ROI with AFM topography

  • Collect NanoIR spectra on the ROI and nearby background

  • Identify likely material/functional groups and provide interpretation

IR Chemical Mapping (Component Distribution)

Best for: phase separation, migration, thin film non-uniformity

  • Choose diagnostic IR band(s) for components of interest

  • Generate chemical maps and correlate with AFM morphology

  • Summarize domain size, distribution, and key differences (project-dependent)

Comparative Study (“What Changed?”)

Best for: supplier/process changes, aging effects

  • Same mapping plan on reference vs suspect

  • Overlay spectra + compare maps

  • Clear summary of what is different, where it is located, and likely implications

What You Receive

  • AFM images (topography and related channels, scope-dependent)

  • NanoIR spectra from key ROIs with interpretation notes

  • Chemical maps at selected band(s) (if included)

  • Comparison summary (reference vs suspect) with clear “delta” findings

  • Recommended next steps if confirmatory methods are needed (e.g., Raman/FTIR, ToF-SIMS, Py-GC/MS)

Sample Submission Guidelines

Please provide

  • Material type and your question (domain ID, residue, thin film uniformity, interface failure)

  • ROI location/orientation (photos and marking are very helpful)

  • Process and storage history (heat/UV/cleaning/solvent exposure)

  • Reference/control sample whenever possible

  • Any constraints (do-not-clean, contamination-sensitive surfaces)

Packaging tips

  • Protect surfaces from fingerprints, dust, and rubbing (gloves + clean containers)

  • Separate reference vs suspect samples clearly

  • For fragile films, use rigid carriers to prevent creasing/scratching

FAQs

It’s designed for nanoscale regions; reported spatial resolution can reach the ~10 nm class in optimized modes/instruments, but real-world performance depends strongly on sample, surface condition, and measurement mode.

It’s designed for nanoscale regions; reported spatial resolution can reach the ~10 nm class in optimized modes/instruments, but real-world performance depends strongly on sample, surface condition, and measurement mode.

Not usually. ToF-SIMS is extremely sensitive for surface species and mapping, while NanoIR provides IR-bonding fingerprints with AFM-correlated morphology. They’re often complementary.

Typically low-impact, but the AFM tip contacts/taps the surface and the area is exposed to IR excitation; very soft or delicate surfaces may require special settings (project-dependent).

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