SPM
What Is SPM (Scanning Probe Microscopy)?
SPM (Scanning Probe Microscopy) is a family of high-resolution surface analysis techniques that use a sharp probe (tip) to scan across a surface and measure interactions between the tip and the sample. The most common SPM method is AFM (Atomic Force Microscopy), which can generate nanoscale 3D topography and, depending on the mode, map mechanical, electrical, and adhesion-related properties.
SPM is widely used when you need to understand surfaces and interfaces at the micro-to-nano scale—answering questions like: “How rough is the surface at the nanoscale?” “Is there a thin film or residue?” “Are there local stiffness/adhesion differences?”
What SPM Is Used For
SPM/AFM is commonly used to evaluate:
Surface roughness & texture at nano-to-micro scale (Ra/Rq; Sa/Sq for area scans)
Coating and thin film morphology (grain features, pinholes, texture bands)
Particles and surface defects (nodules, pits, scratches, micro-cracks—project-dependent)
Wear and tribology surfaces (wear tracks, transfer films—project-dependent)
Adhesion and friction contrast (qualitative or quantitative, mode dependent)
Mechanical mapping (modulus/stiffness trends, viscoelastic contrast—project-dependent)
Electrical property mapping (project-dependent): conductive AFM, surface potential, local leakage pathways
Phase separation in polymers (domain size and distribution, project-dependent)
Why SPM (vs. SEM, OP, or Profilometers)?
Compared with SEM: SEM shows surface morphology with excellent imaging, but SPM provides true height (z) information and can map mechanical/adhesion properties.
Compared with optical profilometry (OP): OP is fast for larger areas, but SPM reaches much finer lateral resolution for nanoscale roughness and microfeatures.
Compared with stylus profilometers: SPM can be gentler on delicate surfaces and provides 3D maps rather than only line profiles (mode dependent).
Sample Types We Support
SPM can be applied to many surfaces (project-dependent), including:
Thin films & coatings: functional coatings, barrier layers, protective films
Metals & alloys: polished/treated surfaces, corrosion morphology (project-dependent)
Polymers & plastics: films, molded parts, textured surfaces
Semiconductors & electronics: wafers/coupons, thin film stacks, contamination films (project-dependent)
Adhesives & soft materials (project-dependent): tack/adhesion differences, residue films
Biomaterials (project-dependent): surface morphology and property contrast
Best practice: provide a reference/control sample for comparisons.
Typical Workflows
Topography & Roughness Characterization (Most Common)
Best for: surface finish qualification, process monitoring
Define scan size(s) and roughness parameters
Provide 2D/3D maps and roughness statistics
Optional multi-location mapping for uniformity (project-dependent)
Defect / Particle Characterization
Best for: microfeatures driving performance issues
Locate the defect/particle and capture high-resolution maps
Measure feature height, width, and local roughness
Optional correlation with SEM-EDS or spectroscopy for ID (project-dependent)
Property Mapping (Project-Dependent)
Best for: local stiffness/adhesion/electrical differences
Select appropriate mode (phase imaging, force mapping, conductive modes, etc.)
Map property contrast and correlate with topography
Summarize key differences across ROIs or samples
Comparative Study (“What Changed?”)
Best for: process/supplier changes, aging effects
Same scan plan on reference vs suspect
Overlay roughness distributions and feature metrics
Clear summary of meaningful differences
What You Receive
2D/3D SPM images (topography) with scan size and scale
Roughness metrics and feature measurements (scope-dependent)
Optional property maps (mechanical/adhesion/electrical, project-dependent)
Comparison summary (reference vs suspect) with “delta” findings
Practical conclusions and recommended next steps (if additional chemistry/ID is needed)
Sample Submission Guidelines
Please provide
Material and surface condition (coating, polish, treatment)
Your goal (roughness, defect, film morphology, property mapping, comparison)
Any spec limits (target Ra/Sa, max defect height, etc.)
ROI marking/orientation and photos if available
Reference/control sample whenever possible
Packaging tips
Protect surfaces from fingerprints, dust, and scratches (gloves + clean bags)
Avoid stacking samples face-to-face
Label orientation (top/bottom, process direction) when relevant
FAQs
Is SPM the same as AFM?
AFM is the most common type of SPM. SPM is the broader family that includes AFM and other probe-based methods.
How large an area can you scan?
SPM can scan from very small areas (sub-micron) up to larger regions (tens to hundreds of microns), depending on the mode and time constraints (project-dependent).
Can SPM measure coating thickness?
It can measure step height if there’s a clear step/edge or scratch window to the substrate. For full thickness mapping, OP/ellipsometry/XRR may be better (project-dependent).
Is SPM destructive?
Typically low-impact, but the tip contacts/taps the surface. Very soft or sticky materials may require special modes to minimize disturbance (project-dependent).
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